Uncertainty of the X-ray Diffraction (XRD) sin2 ψ Technique in Measuring Residual Stresses of Physical Vapor Deposition (PVD) Hard Coatings

Uncertainty of the X-ray Diffraction (XRD) sin2 ψ Technique in Measuring Residual Stresses of Physical Vapor Deposition (PVD) Hard Coatings

Residual stresses of physical vapor deposition (PVD) hard coatings can be measured using X-ray diffraction (XRD) methods under either conventional d-sin2 ψ mode or glancing incident (GIXRD) mode, in which substantial uncertainties exist depending on the applied diffraction parameters. This paper rep...

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Bibliographic Details
Main Authors: Quanshun Luo, Shicai Yang
Format: Article
Language:English
Published: MDPI AG 2017-08-01
Series:Coatings
Subjects:
PVD hard coatings
residual stresses measurement
X-ray diffraction
Online Access:https://www.mdpi.com/2079-6412/7/8/128

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https://www.mdpi.com/2079-6412/7/8/128

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