SECOND MOMENT MEASURE AND K-FUNCTION FOR PLANAR STIT TESSELLATIONS

For STIT tessellations – stationary tessellations that are stable under the operation iteration of tessellations – the second-ordermeasure of the edge system is studied. A result is that this measure coincides with that one of a Boolean segment process. In the isotropic case an explicit formula for...

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Bibliographic Details
Main Authors: Viola Weiss, Joachim Ohser, Werner Nagel
Format: Article
Language:English
Published: Slovenian Society for Stereology and Quantitative Image Analysis 2011-05-01
Series:Image Analysis and Stereology
Subjects:
Online Access:http://www.ias-iss.org/ojs/IAS/article/view/876