Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress

Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress

Abstract Background As one of the most important food crops in the world, increasing wheat (Triticum aestivum L.) yield is an urgent task for global food security under the continuous threat of stripe rust (caused by Puccinia striiformis f. sp. tritici) in many regions of the world. Molecular marker...

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Bibliographic Details
Main Authors: Xueling Ye, Jian Li, Yukun Cheng, Fangjie Yao, Li Long, Yuqi Wang, Yu Wu, Jing Li, Jirui Wang, Qiantao Jiang, Houyang Kang, Wei Li, Pengfei Qi, Xiujin Lan, Jian Ma, Yaxi Liu, Yunfeng Jiang, Yuming Wei, Xianming Chen, Chunji Liu, Youliang Zheng, Guoyue Chen
Format: Article
Language:English
Published: BMC 2019-08-01
Series:BMC Genomics
Subjects:
Wheat
55 K SNP
Genome-wide association study
Yield-related traits
Stripe rust
Online Access:http://link.springer.com/article/10.1186/s12864-019-6005-6

Internet

http://link.springer.com/article/10.1186/s12864-019-6005-6

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