CryoEM at 100 keV: a demonstration and prospects

CryoEM at 100 keV: a demonstration and prospects

100 kV is investigated as the operating voltage for single-particle electron cryomicroscopy (cryoEM). Reducing the electron energy from the current standard of 300 or 200 keV offers both cost savings and potentially improved imaging. The latter follows from recent measurements of radiation damage to...

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Bibliographic Details
Main Authors: K. Naydenova, G. McMullan, M. J. Peet, Y. Lee, P. C. Edwards, S. Chen, E. Leahy, S. Scotcher, R. Henderson, C. J. Russo
Format: Article
Language:English
Published: International Union of Crystallography 2019-11-01
Series:IUCrJ
Subjects:
advances in microscope hardware
single-particle cryoem
electron cryomicroscopy
low-dose electron microscopy
structure determination
single-particle reconstruction
direct detectors
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252519012612

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http://scripts.iucr.org/cgi-bin/paper?S2052252519012612

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