Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxid...

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Bibliographic Details
Main Authors: Mohamed Abdel-Rahman, Esam Bahidra, Ahmed Fauzi Abas
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Materials
Subjects:
vanadium sesquioxide
thin film
thermo-optic coefficient
infrared ellipsometry
optical constants
Online Access:https://www.mdpi.com/1996-1944/13/8/2002

Internet

https://www.mdpi.com/1996-1944/13/8/2002

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