Reliability Determination of Nanoelectronic Devices Using Semi-Marcov Processes
The main purpose of the article is to investigate the reliability process of nanoelectronics devices. Firstly, the research problem is presented based on foreign data source. Then, the analytical method has been chosen – semi-Marcov processes. Next, according to the adopted method and input data, th...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sciendo
2020-10-01
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| Series: | Journal of KONBiN |
| Subjects: | |
| Online Access: | https://doi.org/10.2478/jok-2020-0062 |