Superior polarization retention through engineered domain wall pinning

The use of ferroelectric materials in memory device applications is held back by low retention times. Here, the authors demonstrate that by intentionally introducing defective nanoregions which increase the activation field for domain wall motion, retention times larger than a year can be achieved.

Bibliographic Details
Main Authors: Dawei Zhang, Daniel Sando, Pankaj Sharma, Xuan Cheng, Fan Ji, Vivasha Govinden, Matthew Weyland, Valanoor Nagarajan, Jan Seidel
Format: Article
Language:English
Published: Nature Publishing Group 2020-01-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-019-14250-7