Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background

Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background

The detection of dislocation defects in polysilicon wafers helps to improve the power generation efficiency and service life of solar cells. However, dislocation defect detection is challenging due to similarity of morphology and intensity between the non-uniform random texture background and disloc...

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Bibliographic Details
Main Authors: Haiyong Chen, Jiali Liu, Shuang Wang, Kun Liu
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Polysilicon wafer
image enhancement
contour detection
image segmentation
near-infrared image
Online Access:https://ieeexplore.ieee.org/document/8843872/

Internet

https://ieeexplore.ieee.org/document/8843872/

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