Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background
The detection of dislocation defects in polysilicon wafers helps to improve the power generation efficiency and service life of solar cells. However, dislocation defect detection is challenging due to similarity of morphology and intensity between the non-uniform random texture background and disloc...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2019-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8843872/ |