Morphology Analysis of Si Island Arrays on Si(001)

Morphology Analysis of Si Island Arrays on Si(001)

<p>Abstract</p> <p>The formation of nanometer-scale islands is an important issue for bottom-up-based schemes in novel electronic, optoelectronic and magnetoelectronic devices technology. In this work, we present a detailed atomic force microscopy analysis of Si island arrays grown...

Full description

Bibliographic Details
Main Authors: Gonz&#225;lez-Gonz&#225;lez A, Alonso M, Navarro E, Saced&#243;n JL, Ruiz A
Format: Article
Language:English
Published: SpringerOpen 2010-01-01
Series:Nanoscale Research Letters
Subjects:
Silicon nanostructures
Molecular beam epitaxy
Self-assembly
Scanning probe microscopy
Morphology analysis
Online Access:http://dx.doi.org/10.1007/s11671-010-9725-8

Internet

http://dx.doi.org/10.1007/s11671-010-9725-8

Similar Items