Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure
An ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF–HCF–SMF fiber structure can measure coating thickness down to...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-04-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/20/7/2035 |