TEM sample preparation using micro-manipulator for in-situ MEMS experiment
Abstract Growing demands for comprehending complicated nano-scale phenomena in atomic resolution has attracted in-situ transmission electron microscopy (TEM) techniques for understanding their dynamics. However, simple to safe TEM sample preparation for in-situ observation has been limited. Here, we...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2021-06-01
|
| Series: | Applied Microscopy |
| Subjects: | |
| Online Access: | https://doi.org/10.1186/s42649-021-00057-8 |