Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films
The paper presents the investigation by conductive-atomic force microscopy (C-AFM) of the variation of the local conductivity and topography of the transparent ZnO thin films deposed onto soda lima glass substrates by spin-coating of pre-prepared ZnO nanoparticles. With conductivity measurements at...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Galati University Press
2015-06-01
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| Series: | The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science |
| Subjects: | |
| Online Access: | https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/1329 |