Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials

Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials

We present here a method for the quantitative prediction of the spectroscopic specular reflectivity line-shape in anisotropic layered media. The method is based on a 4 × 4 matrix formalism and on the simulation from the first principles (through density functional theory—DFT) of the anisotropic abso...

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Bibliographic Details
Main Authors: Luca Pasquali, Nicola Mahne, Angelo Giglia, Adriano Verna, Lorenzo Sponza, Raffaella Capelli, Matteo Bonfatti, Francesco Mezzadri, Emanuele Galligani, Stefano Nannarone
Format: Article
Language:English
Published: MDPI AG 2021-01-01
Series:Surfaces
Subjects:
soft X-ray reflectivity
anisotropic optical properties
organic thin films
Online Access:https://www.mdpi.com/2571-9637/4/1/4

Internet

https://www.mdpi.com/2571-9637/4/1/4

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