A Digital-Twin-Assisted Fault Diagnosis Using Deep Transfer Learning
Digital twin is a significant way to achieve smart manufacturing, and provides a new paradigm for fault diagnosis. Traditional data-based fault diagnosis methods mostly assume that the training data and test data are following the same distribution and can acquire sufficient data to train a reliable...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8598879/ |