Enhanced memory characteristics in organic ferroelectric field-effect transistors through thermal annealing

We report on the memory characteristics of organic ferroelectric field-effect transistors (FeFETs) using spin-coated poly(vinylidene difluoride/trifluoroethylene) (P(VDF/TrFE)) as a gate insulating layer. By thermal annealing the P(VDF/TrFE) layer at temperatures above its melting point, we could si...

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Bibliographic Details
Main Authors: Ryo Sugano, Tomoya Tashiro, Tomohito Sekine, Kenjiro Fukuda, Daisuke Kumaki, Shizuo Tokito
Format: Article
Language:English
Published: AIP Publishing LLC 2015-11-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4935342