Analysis of a mechanical structure of a microscope sensor of atomic force / Atominių jėgų mikroskopo jutiklio mechaninės struktūros analizė
Atomic Force Microscopy (AFM) is a method that allows obtaining an image of the surface of the sample in high resolution. This article investigates the problems associated with modeling a mechanical structure of a microscope sensor of atomic force.The paper refers to the previous scientists’ works...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Vilnius Gediminas Technical University
2015-03-01
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| Series: | Mokslas: Lietuvos Ateitis |
| Subjects: | |
| Online Access: | http://journals.vgtu.lt/index.php/MLA/article/view/3620 |