Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution

Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution

Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the convent...

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Bibliographic Details
Main Authors: Weijie Kong, Changtao Wang, Mingbo Pu, Xiaoliang Ma, Xiong Li, Xiangang Luo
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Photonics Journal
Subjects:
Fluorescence microscopy
Photonic crystals
Subwavelength structures
Online Access:https://ieeexplore.ieee.org/document/9296838/

Internet

https://ieeexplore.ieee.org/document/9296838/

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