Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution
Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the convent...
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doaj-c9094a3111684faa922614bdecc2c7372021-03-29T18:04:19ZengIEEEIEEE Photonics Journal1943-06552021-01-011311910.1109/JPHOT.2020.30449209296838Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm ResolutionWeijie Kong0Changtao Wang1Mingbo Pu2Xiaoliang Ma3Xiong Li4Xiangang Luo5https://orcid.org/0000-0002-1401-1670State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, ChinaState Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, ChinaState Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, ChinaState Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, ChinaState Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, ChinaState Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, ChinaStructured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility.https://ieeexplore.ieee.org/document/9296838/Fluorescence microscopyPhotonic crystalsSubwavelength structures |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Weijie Kong Changtao Wang Mingbo Pu Xiaoliang Ma Xiong Li Xiangang Luo |
spellingShingle |
Weijie Kong Changtao Wang Mingbo Pu Xiaoliang Ma Xiong Li Xiangang Luo Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution IEEE Photonics Journal Fluorescence microscopy Photonic crystals Subwavelength structures |
author_facet |
Weijie Kong Changtao Wang Mingbo Pu Xiaoliang Ma Xiong Li Xiangang Luo |
author_sort |
Weijie Kong |
title |
Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution |
title_short |
Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution |
title_full |
Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution |
title_fullStr |
Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution |
title_full_unstemmed |
Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution |
title_sort |
bloch surface wave assisted structured illumination microscopy for sub-100 nm resolution |
publisher |
IEEE |
series |
IEEE Photonics Journal |
issn |
1943-0655 |
publishDate |
2021-01-01 |
description |
Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility. |
topic |
Fluorescence microscopy Photonic crystals Subwavelength structures |
url |
https://ieeexplore.ieee.org/document/9296838/ |
work_keys_str_mv |
AT weijiekong blochsurfacewaveassistedstructuredilluminationmicroscopyforsub100x00a0nmresolution AT changtaowang blochsurfacewaveassistedstructuredilluminationmicroscopyforsub100x00a0nmresolution AT mingbopu blochsurfacewaveassistedstructuredilluminationmicroscopyforsub100x00a0nmresolution AT xiaoliangma blochsurfacewaveassistedstructuredilluminationmicroscopyforsub100x00a0nmresolution AT xiongli blochsurfacewaveassistedstructuredilluminationmicroscopyforsub100x00a0nmresolution AT xiangangluo blochsurfacewaveassistedstructuredilluminationmicroscopyforsub100x00a0nmresolution |
_version_ |
1724196875475615744 |