Crystalline characteristics of annealed AlN films by pulsed laser treatment for solidly mounted resonator applications

Abstract AlN films were deposited on Si substrates using a reactive RF magnetron sputtering process and then the films were annealed by using different laser powers and wavelengths (355 nm, 532 nm and 1064 nm). For all three laser systems, the (002) peak intensity was obviously improved following la...

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Bibliographic Details
Main Authors: H. K. Lin, Y. J. Huang, W. C. Shih, Y. C. Chen, W. T. Chang
Format: Article
Language:English
Published: BMC 2019-03-01
Series:BMC Chemistry
Subjects:
AlN
Online Access:http://link.springer.com/article/10.1186/s13065-019-0550-6

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