Enhanced NO<sub>2</sub> Sensing Performance of Graphene with Thermally Induced Defects

Enhanced NO<sub>2</sub> Sensing Performance of Graphene with Thermally Induced Defects

This paper demonstrates the enhanced NO<sub>2</sub> sensing performance of graphene with defects generated by rapid thermal annealing (RTA). A high temperature of RTA (300–700 °C) was applied to graphene under an argon atmosphere to form defects on sp<sup>2</sup> carbon latti...

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Bibliographic Details
Main Authors: Namsoo Lim, Hyeonghun Kim, Yusin Pak, Young Tae Byun
Format: Article
Language:English
Published: MDPI AG 2021-04-01
Series:Materials
Subjects:
graphene
defects
rapid thermal annealing
nitrogen dioxide
gas sensor
Online Access:https://www.mdpi.com/1996-1944/14/9/2347

Internet

https://www.mdpi.com/1996-1944/14/9/2347

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