Accelerated life tests for modified Kies exponential lifetime distribution: binomial removal, transformers turn insulation application and numerical results

Accelerated life tests for modified Kies exponential lifetime distribution: binomial removal, transformers turn insulation application and numerical results

This paper is concerned with statistical inference of multiple constant-stress testing for progressive type-II censored data with binomial removal. The failure times of the test units are assumed to be independent and follow the modified Kies exponential (MKEx) distribution. The maximum likelihood m...

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Bibliographic Details
Main Authors: A. M. Abd El-Raheem, Ehab M. Almetwally, M. S. Mohamed, E. H. Hafez
Format: Article
Language:English
Published: AIMS Press 2021-03-01
Series:AIMS Mathematics
Subjects:
modified kies family
constant-stress
progressive type-ii censoring
maximum likelihood
bayesian estimation
modified kolmogorov-smirnov
Online Access:http://www.aimspress.com/article/doi/10.3934/math.2021310?viewType=HTML

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http://www.aimspress.com/article/doi/10.3934/math.2021310?viewType=HTML

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