Deep learning ferroelectric polarization distributions from STEM data via with and without atom finding

Abstract Over the last decade, scanning transmission electron microscopy (STEM) has emerged as a powerful tool for probing atomic structures of complex materials with picometer precision, opening the pathway toward exploring ferroelectric, ferroelastic, and chemical phenomena on the atomic scale. An...

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Bibliographic Details
Main Authors: Christopher T. Nelson, Ayana Ghosh, Mark Oxley, Xiaohang Zhang, Maxim Ziatdinov, Ichiro Takeuchi, Sergei V. Kalinin
Format: Article
Language:English
Published: Nature Publishing Group 2021-09-01
Series:npj Computational Materials
Online Access:https://doi.org/10.1038/s41524-021-00613-6