Based on Similarity Metric Learning for Semi-Supervised Clustering
Semi-supervised clustering employs a small amount of labeled data to aid unsupervised learning. The focus of this paper is on Metric Learning, with particular interest in incorporating side information to make it semi-supervised. This study is primarily motivated by an application: face-image cluste...
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| Format: | Article |
| Language: | English |
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IFSA Publishing, S.L.
2014-08-01
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| Series: | Sensors & Transducers |
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| Online Access: | http://www.sensorsportal.com/HTML/DIGEST/august_2014/Vol_177/P_2339.pdf |