Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials
The important role of surface sensitive characterization techniques such as Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS), time of flight scanning ion mass spectrometry (TOF-SIMS) and High resolution transmission electron microscopy (HRTEM) for the characterization of di...
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| Format: | Article |
| Language: | English |
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MDPI AG
2017-08-01
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| Series: | Materials |
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| Online Access: | https://www.mdpi.com/1996-1944/10/8/906 |