Short-Latency Artifacts Associated with Concurrent TMS–EEG

Short-Latency Artifacts Associated with Concurrent TMS–EEG

Background: Concurrent transcranial magnetic stimulation and electroencephalography (TMS–EEG) is an emerging method for studying cortical network properties. However, various artifacts affect measurement of TMS-evoked cortical potentials (TEPs), especially within 30 ms of stimulation. Objective/hypo...

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Bibliographic Details
Main Authors: Nigel C. Rogasch, Richard H. Thomson, Zafiris J. Daskalakis, Paul B. Fitzgerald
Format: Article
Language:English
Published: Elsevier 2013-11-01
Series:Brain Stimulation
Subjects:
Transcranial magnetic stimulation
Electroencephalography
Artifact
Muscle
Online Access:http://www.sciencedirect.com/science/article/pii/S1935861X1300096X

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http://www.sciencedirect.com/science/article/pii/S1935861X1300096X

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