In-Built N<sup>+</sup> Pocket Electrically Doped Tunnel FET With Improved DC and Analog/RF Performance

In this paper, we present an in-built N<sup>+</sup> pocket electrically doped tunnel FET (ED-TFET) based on the polarity bias concept that enhances the DC and analog/RF performance. The proposed device begins with a MOSFET like structure (n-p-n) with a control gate (CG) and a polarity ga...

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Bibliographic Details
Main Authors: Jun Li, Ying Liu, Su-fen Wei, Chan Shan
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/11/11/960