Reliability of Miniaturized Transistors from the Perspective of Single-Defects

Reliability of Miniaturized Transistors from the Perspective of Single-Defects

To analyze the reliability of semiconductor transistors, changes in the performance of the devices during operation are evaluated. A prominent effect altering the device behavior are the so called bias temperature instabilities (BTI), which emerge as a drift of the device threshold voltage over time...

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Bibliographic Details
Main Author: Michael Waltl
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Micromachines
Subjects:
device reliability
nanoscale transistor
bias temperature instabilities (BTI)
defects
single-defect spectroscopy
non-radiative multiphonon (NMP) model
Online Access:https://www.mdpi.com/2072-666X/11/8/736

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https://www.mdpi.com/2072-666X/11/8/736

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