Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

This <italic>review paper</italic> assesses the main approaches in the electrical characterization of advanced MOSFETs towards their future analog and RF applications. Those approaches are shown to be different from the traditionally used ones for the assessment of the device perspective...

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Bibliographic Details
Main Authors: Valeriya Kilchytska, Sergej Makovejev, Babak Kazemi Esfeh, Lucas Nyssens, Arka Halder, Jean-Pierre Raskin, Denis Flandre
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Analog and RF figures of merit
FDSOI
FinFET
MOSFET
self-heating
S-parameters
Online Access:https://ieeexplore.ieee.org/document/9349757/

Internet

https://ieeexplore.ieee.org/document/9349757/

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