Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler−...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2019-11-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/19/22/4990 |