Contact Resonance Atomic Force Microscopy Using Long, Massive Tips

In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler−...

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Bibliographic Details
Main Authors: Tony Jaquez-Moreno, Matteo Aureli, Ryan C. Tung
Format: Article
Language:English
Published: MDPI AG 2019-11-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/19/22/4990