Iterative Pseudo-Soft-Reliability-Based Majority-Logic Decoding for NAND Flash Memory

Iterative Pseudo-Soft-Reliability-Based Majority-Logic Decoding for NAND Flash Memory

This paper proposes a decoding algorithm for nonbinary low-density parity-check (NB-LDPC) codes, aiming to improve the error rate performance for NAND flash memory. Several NB-LDPC decoding methods for NAND flash memory have been studied. Some approaches rely on hard decisions, and these are relativ...

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Bibliographic Details
Main Authors: Kyeong Bin Park, Ki-Seok Chung
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Error correction codes
Hamming distance
hard decision
iterative hard-reliability-based majority-logic decoding algorithm
NAND flash memory
nonbinary low-density parity-check codes
Online Access:https://ieeexplore.ieee.org/document/9430504/

Internet

https://ieeexplore.ieee.org/document/9430504/

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