Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS<sub>2</sub> Flakes

Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS<sub>2</sub> Flakes

We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS2 (molybdenum disulfide) flakes on a SiO2/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transport an...

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Bibliographic Details
Main Authors: Laura Iemmo, Francesca Urban, Filippo Giubileo, Maurizio Passacantando, Antonio Di Bartolomeo
Format: Article
Language:English
Published: MDPI AG 2020-01-01
Series:Nanomaterials
Subjects:
molybdenum disulfide
field effect transistor
field emission
contacts
electric transport
Online Access:https://www.mdpi.com/2079-4991/10/1/106

Internet

https://www.mdpi.com/2079-4991/10/1/106

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