Direct Characterization of the Relation between the Mechanical Response and Microstructure Evolution in Aluminum by Transmission Electron Microscopy In Situ Straining

Direct Characterization of the Relation between the Mechanical Response and Microstructure Evolution in Aluminum by Transmission Electron Microscopy In Situ Straining

Transmission electron microscopy in situ straining experiments of Al single crystals with different initial lattice defect densities have been performed. The as-focused ion beam (FIB)-processed pillar sample contained a high density of prismatic dislocation loops with the <111> Burgers vector,...

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Bibliographic Details
Main Authors: Seiichiro Ii, Takero Enami, Takahito Ohmura, Sadahiro Tsurekawa
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Materials
Subjects:
transmission electron microscopy (TEM), in situ straining
indentation
dislocation
plastic deformation
Online Access:https://www.mdpi.com/1996-1944/14/6/1431

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https://www.mdpi.com/1996-1944/14/6/1431

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