Anomaly Detection and Automatic Labeling for Solar Cell Quality Inspection Based on Generative Adversarial Network
Quality inspection applications in industry are required to move towards a zero-defect manufacturing scenario, with non-destructive inspection and traceability of 100% of produced parts. Developing robust fault detection and classification models from the start-up of the lines is challenging due to...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-06-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/21/13/4361 |