Combining scanning probe microscopy and x-ray spectroscopy

Combining scanning probe microscopy and x-ray spectroscopy

<p>Abstract</p> <p>A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the vis...

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Bibliographic Details
Main Authors: Bjeoumikhov Aniouar, Ferrero Sylvain, Pailharey Daniel, Dahmani Brahim, Purans Juris, Larcheri Sylvia, Graziola Roberto, Erko Alexei, Zizak Ivo, Fauquet Carole, Dehlinger Ma&#235;l, Jandard Franck, Tonneau Didier
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/308

Internet

http://www.nanoscalereslett.com/content/6/1/308

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