Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy
Hot compression tests of Cu-Ni-Si alloy with high Ni and Si contents were performed at the deformation temperatures of 750–950 °C, and the strain rates of 0.01–10 s−1 on a Gleeble-3800 thermo-mechanical simulator. The critical conditions for dynamic recrystallization (DRX) of Cu-Ni-Si alloy were obt...
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doaj-d0aa5c21656e4beaa05ec88f86bc96952020-11-25T02:53:17ZengElsevierResults in Physics2211-37972019-12-0115Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloyJinlong Zhang0Zhenlin Lu1Lei Jia2Hui Xie3Shiping Tao4Xin Wei5Ying Ma6School of Materials Science and Engineering, Xi’an University of Technology, Xi’an 710084, China; School of Materials Engineering, Xi’an Aeronautical University, Xi’an 710077, ChinaSchool of Materials Science and Engineering, Xi’an University of Technology, Xi’an 710084, China; Corresponding author.School of Materials Science and Engineering, Xi’an University of Technology, Xi’an 710084, ChinaSchool of Materials Engineering, Xi’an Aeronautical University, Xi’an 710077, ChinaSchool of Materials Engineering, Xi’an Aeronautical University, Xi’an 710077, ChinaSchool of Materials Engineering, Xi’an Aeronautical University, Xi’an 710077, ChinaSchool of Materials Engineering, Xi’an Aeronautical University, Xi’an 710077, ChinaHot compression tests of Cu-Ni-Si alloy with high Ni and Si contents were performed at the deformation temperatures of 750–950 °C, and the strain rates of 0.01–10 s−1 on a Gleeble-3800 thermo-mechanical simulator. The critical conditions for dynamic recrystallization (DRX) of Cu-Ni-Si alloy were obtained by processing the collected data and combining with the inflection point of θ-σ curve with the minimum value criterion of −∂θ/∂σ-σ curve. There was a certain correlation between the critical strain (εc) and the peak strain (εp), that was, εc/εp = 0.723, and the functional relationship between εc and Z parameter was εc = 1.05 × 10−3Z0.059. The average recrystallized grain size under various deformation conditions was measured, and the DRX grain growth model of Cu-Ni-Si alloy was established as dDRX = 5650.4ε̇−0.12891exp(−73142/RT). Keywords: Cu-Ni-Si alloy, Dynamic recrystallization, Critical condition, Grain growth modelhttp://www.sciencedirect.com/science/article/pii/S2211379719305170 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Jinlong Zhang Zhenlin Lu Lei Jia Hui Xie Shiping Tao Xin Wei Ying Ma |
spellingShingle |
Jinlong Zhang Zhenlin Lu Lei Jia Hui Xie Shiping Tao Xin Wei Ying Ma Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy Results in Physics |
author_facet |
Jinlong Zhang Zhenlin Lu Lei Jia Hui Xie Shiping Tao Xin Wei Ying Ma |
author_sort |
Jinlong Zhang |
title |
Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy |
title_short |
Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy |
title_full |
Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy |
title_fullStr |
Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy |
title_full_unstemmed |
Critical conditions and grain growth model for dynamic recrystallization of Cu-Ni-Si alloy |
title_sort |
critical conditions and grain growth model for dynamic recrystallization of cu-ni-si alloy |
publisher |
Elsevier |
series |
Results in Physics |
issn |
2211-3797 |
publishDate |
2019-12-01 |
description |
Hot compression tests of Cu-Ni-Si alloy with high Ni and Si contents were performed at the deformation temperatures of 750–950 °C, and the strain rates of 0.01–10 s−1 on a Gleeble-3800 thermo-mechanical simulator. The critical conditions for dynamic recrystallization (DRX) of Cu-Ni-Si alloy were obtained by processing the collected data and combining with the inflection point of θ-σ curve with the minimum value criterion of −∂θ/∂σ-σ curve. There was a certain correlation between the critical strain (εc) and the peak strain (εp), that was, εc/εp = 0.723, and the functional relationship between εc and Z parameter was εc = 1.05 × 10−3Z0.059. The average recrystallized grain size under various deformation conditions was measured, and the DRX grain growth model of Cu-Ni-Si alloy was established as dDRX = 5650.4ε̇−0.12891exp(−73142/RT). Keywords: Cu-Ni-Si alloy, Dynamic recrystallization, Critical condition, Grain growth model |
url |
http://www.sciencedirect.com/science/article/pii/S2211379719305170 |
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