Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology

Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology

Single-event effects (SEEs) in integrated circuits and devices can be studied by utilizing ultra-fast pulsed laser system through Two Photon Absorption process. This paper presents technical ways to characterize key factors for laser based SEEs mapping testing system: output power from laser source,...

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Bibliographic Details
Main Authors: Cheng Gu, Rui Chen, George Belev, Shuting Shi, Haonan Tian, Issam Nofal, Li Chen
Format: Article
Language:English
Published: MDPI AG 2019-10-01
Series:Materials
Subjects:
pulsed laser
single event effect
sram
two photon absorption
sensitive mapping
Online Access:https://www.mdpi.com/1996-1944/12/20/3411

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https://www.mdpi.com/1996-1944/12/20/3411

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