Structural Evolution of MoO<sub>3</sub> Thin Films Deposited on Copper Substrates upon Annealing: An X-ray Absorption Spectroscopy Study

Structural Evolution of MoO<sub>3</sub> Thin Films Deposited on Copper Substrates upon Annealing: An X-ray Absorption Spectroscopy Study

Structural changes of MoO<sub>3</sub> thin films deposited on thick copper substrates upon annealing at different temperatures were investigated via ex situ X-Ray Absorption Spectroscopy (XAS). From the analysis of the X-ray Absorption Near-Edge Structure (XANES) pre-edge and Extended X-...

Full description

Bibliographic Details
Main Authors: Salvatore Macis, Javad Rezvani, Ivan Davoli, Giannantonio Cibin, Bruno Spataro, Jessica Scifo, Luigi Faillace, Augusto Marcelli
Format: Article
Language:English
Published: MDPI AG 2019-04-01
Series:Condensed Matter
Subjects:
molybdenum
TM oxides
XAFS
thin films
Online Access:https://www.mdpi.com/2410-3896/4/2/41

Internet

https://www.mdpi.com/2410-3896/4/2/41

Similar Items