Multiple Fault Location in a Photovoltaic Array Using Bidirectional Hetero-Associative Memory Network in Micro-Distribution Systems

Multiple Fault Location in a Photovoltaic Array Using Bidirectional Hetero-Associative Memory Network in Micro-Distribution Systems

In manual maintenance inspections of large-scaled photovoltaic (PV) or rooftop PV systems, several days are required to survey the entire PV field. To improve reliability and shorten the amount of time involved, this study proposes an electrical examination-based method for locating multiple faults...

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Bibliographic Details
Main Authors: Long-Yi Chang, Neng-Sheng Pai, Min-Hung Chou, Jian-Liung Chen, Chao-Lin Kuo, Chia-Hung Lin
Format: Article
Language:English
Published: MDPI AG 2018-08-01
Series:Crystals
Subjects:
rooftop photovoltaic (PV) system
maximum power point tracking (MPPT)
power degradation index
bidirectional hetero-associative memory network (BHAM)
Online Access:http://www.mdpi.com/2073-4352/8/8/327

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http://www.mdpi.com/2073-4352/8/8/327

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