The Phase Evolution and Physical Properties of Binary Copper Oxide Thin Films Prepared by Reactive Magnetron Sputtering

P-type binary copper oxide semiconductor films for various O2 flow rates and total pressures (Pt) were prepared using the reactive magnetron sputtering method. Their morphologies and structures were detected by X-ray diffraction, Raman spectrometry, and SEM. A phase diagram with Cu2O, Cu4O3, CuO, an...

Full description

Bibliographic Details
Main Authors: Weifeng Zheng, Yue Chen, Xihong Peng, Kehua Zhong, Yingbin Lin, Zhigao Huang
Format: Article
Language:English
Published: MDPI AG 2018-07-01
Series:Materials
Subjects:
Online Access:http://www.mdpi.com/1996-1944/11/7/1253