Thickness Effect on Some Physical Properties of RF Sputtered ZnTe Thin Films for Potential Photovoltaic Applications

Thickness Effect on Some Physical Properties of RF Sputtered ZnTe Thin Films for Potential Photovoltaic Applications

Zinc telluride thin films with different thicknesses were grown onto glass substrates by the rf magnetron sputtering technique, using time as a variable growth parameter. All other deposition process parameters were kept constant. The deposited thin films with thickness from 75 to 460 nm were charac...

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Bibliographic Details
Main Authors: Dumitru Manica, Vlad-Andrei Antohe, Antoniu Moldovan, Rovena Pascu, Sorina Iftimie, Lucian Ion, Mirela Petruta Suchea, Ştefan Antohe
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Nanomaterials
Subjects:
ZnTe
thin films
rf-magneton sputtering
AFM
surface metrology
thickness effect
Online Access:https://www.mdpi.com/2079-4991/11/9/2286

Internet

https://www.mdpi.com/2079-4991/11/9/2286

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