Scattering Phenomena in Porous Sol-Gel-Derived Silica Films

Scattering Phenomena in Porous Sol-Gel-Derived Silica Films

This paper presents the results of investigations of optical scattering phenomena in porous silica films. SiO<sub>2</sub> films were prepared by the sol-gel method and deposited on polished silicon wafers by the dip-coating technique. Fabricated films were studied using integrating spher...

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Bibliographic Details
Main Authors: Janusz Jaglarz, Piotr Dulian, Paweł Karasiński, Paweł Winkowski
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Coatings
Subjects:
sol-gel process
thin films
porous silica film
antireflection coatings
light scattering
spectroscopic ellipsometry
Online Access:https://www.mdpi.com/2079-6412/10/6/509

Internet

https://www.mdpi.com/2079-6412/10/6/509

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