Near-Field Interference Microwave Diagnostics of Cultural Plants and Wood Materials
A schematic solution of the near-field interference microwave microscopy technology is discussed. This solution is implemented in the form of a maximally simplified microscope structure. Testing was conducted to determine the capabilities of this microscope. It is shown that technology can be used t...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2018-01-01
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| Series: | MATEC Web of Conferences |
| Online Access: | https://doi.org/10.1051/matecconf/201815501021 |