Elemental, structural and optical properties of nanocrystalline Zn1−xCuxSe films deposited by close spaced sublimation technique
The elemental composition, film thickness and concentration depth profiles of as-deposited and annealed Zn1−xCuxSe films were studied by the Rutherford backscattering spectrometer (RBS) technique. The films were deposited on glass substrates by close spaced sublimation (CSS) technique. As-deposited...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2017-03-01
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| Series: | Journal of Science: Advanced Materials and Devices |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2468217916301769 |