Memory Operation of Z²-FET Without Selector at High Temperature
The electrical performance of Z<sup>2</sup>-FET and memory operations of matrix are demonstrated at high temperatures up to 125 °C. The sharp subthreshold slope is maintained and the reliable operation is ensured within the memory window of 229 mV even though the turn on volta...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9471808/ |