Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors

The use of microwave imaging is becoming more prevalent for detection of interior hidden defects in manufactured and packaged materials. In applications for detection of hidden moisture, microwave tomography can be used to image the material and then perform an inverse calculation to derive an estim...

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Bibliographic Details
Main Authors: Mathew G. Pelletier, Joseph A. Viera, John Wanjura, Greg Holt
Format: Article
Language:English
Published: MDPI AG 2010-09-01
Series:Sensors
Subjects:
uwb
Online Access:http://www.mdpi.com/1424-8220/10/9/8491/