Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors
We have investigated the effect of electron effective mass (<i>m</i><sub>e</sub>*) and tail acceptor-like edge traps density (<i>N</i><sub>TA</sub>) on the electrical characteristics of amorphous-InGaZnO (a-IGZO) thin-film transistors (TFTs) through nu...
Main Authors: | Jihwan Park, Do-Kyung Kim, Jun-Ik Park, In Man Kang, Jaewon Jang, Hyeok Kim, Philippe Lang, Jin-Hyuk Bae |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-01-01
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Series: | Electronics |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-9292/9/1/119 |
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