Assessment of fit of item response theory models used in large-scale educational survey assessments

Assessment of fit of item response theory models used in large-scale educational survey assessments

Abstract Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item respo...

Full description

Bibliographic Details
Main Authors: Peter W. van Rijn, Sandip Sinharay, Shelby J. Haberman, Matthew S. Johnson
Format: Article
Language:English
Published: SpringerOpen 2016-07-01
Series:Large-scale Assessments in Education
Subjects:
Generalized residual
Item fit
Residual analysis
Two-parameter logistic model
Online Access:http://link.springer.com/article/10.1186/s40536-016-0025-3

Internet

http://link.springer.com/article/10.1186/s40536-016-0025-3

Similar Items