Femtosecond-resolved ablation dynamics of Si in the near field of a small dielectric particle

Femtosecond-resolved ablation dynamics of Si in the near field of a small dielectric particle

In this work we analyze the ablation dynamics of crystalline Si in the intense near field generated by a small dielectric particle located at the material surface when being irradiated with an infrared femtosecond laser pulse (800 nm, 120 fs). The presence of the particle (7.9 μm diameter) leads to...

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Bibliographic Details
Main Authors: Paul Kühler, Daniel Puerto, Mario Mosbacher, Paul Leiderer, Francisco Javier Garcia de Abajo, Jan Siegel, Javier Solis
Format: Article
Language:English
Published: Beilstein-Institut 2013-09-01
Series:Beilstein Journal of Nanotechnology
Subjects:
crystalline Si
fs-resolved microscopy
laser ablation
near-field enhancement
ultrafast dynamics
Online Access:https://doi.org/10.3762/bjnano.4.59

Internet

https://doi.org/10.3762/bjnano.4.59

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