A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform Monitors

This paper presents a fully synthesizable successive-approximation-register (SAR) analog-to-digital converter (ADC) for on-chip distributed waveform monitoring in a low-power system-on-chip (SoC). All blocks in the proposed ADC are designed using only standard digital cells, enabling an auto-generat...

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Main Authors: Jun-Eun Park, Young-Ha Hwang, Deog-Kyoon Jeong
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8708173/
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spelling doaj-da67ede8e5514013b657086fb5a2da9b2021-03-29T22:56:24ZengIEEEIEEE Access2169-35362019-01-017636866369710.1109/ACCESS.2019.29153658708173A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform MonitorsJun-Eun Park0https://orcid.org/0000-0001-6345-7903Young-Ha Hwang1Deog-Kyoon Jeong2https://orcid.org/0000-0003-0436-703XBK21+ Creative Research Engineer Development for IT, Seoul National University, Seoul, South KoreaDepartment of Electrical and Computer Engineering, Seoul National University, Seoul, South KoreaDepartment of Electrical and Computer Engineering, Seoul National University, Seoul, South KoreaThis paper presents a fully synthesizable successive-approximation-register (SAR) analog-to-digital converter (ADC) for on-chip distributed waveform monitoring in a low-power system-on-chip (SoC). All blocks in the proposed ADC are designed using only standard digital cells, enabling an auto-generation based on regular digital design tools. Therefore, the proposed ADC provides enhanced portability and reusability which facilitate integration into various functional blocks requiring testing and diagnosis. To implement the SAR ADC, a synthesizable voltage digital-to-analog converter (VDAC) and a rail-to-rail hybrid comparator are proposed in this paper. An inherited nonlinearity of the standard-cell-based VDAC is compensated by a histogram-based soft calibration which can be easily embedded in a waveform reconstruction module. In addition, an oversampling technique with a redundant error correction method is employed to realize the fully synthesizable design without a sample-and-hold (S/H) circuit. The proposed ADC was fabricated in 28-nm CMOS technology, occupying an active area of 0.002 mm<sup>2</sup>. The ADC achieves 5.39-bit effective-number-of-bit (ENOB) at 500-kS/s sampling rate. The power consumption of the ADC is 92.2 &#x03BC;W with a supply voltage of 0.5 V.https://ieeexplore.ieee.org/document/8708173/Analog-to-digital convertercomparatordigital-to-analog converteron-chip oscilloscoperedundant error correctionstandard-cell-based design
collection DOAJ
language English
format Article
sources DOAJ
author Jun-Eun Park
Young-Ha Hwang
Deog-Kyoon Jeong
spellingShingle Jun-Eun Park
Young-Ha Hwang
Deog-Kyoon Jeong
A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform Monitors
IEEE Access
Analog-to-digital converter
comparator
digital-to-analog converter
on-chip oscilloscope
redundant error correction
standard-cell-based design
author_facet Jun-Eun Park
Young-Ha Hwang
Deog-Kyoon Jeong
author_sort Jun-Eun Park
title A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform Monitors
title_short A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform Monitors
title_full A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform Monitors
title_fullStr A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform Monitors
title_full_unstemmed A 0.5-V Fully Synthesizable SAR ADC for On-Chip Distributed Waveform Monitors
title_sort 0.5-v fully synthesizable sar adc for on-chip distributed waveform monitors
publisher IEEE
series IEEE Access
issn 2169-3536
publishDate 2019-01-01
description This paper presents a fully synthesizable successive-approximation-register (SAR) analog-to-digital converter (ADC) for on-chip distributed waveform monitoring in a low-power system-on-chip (SoC). All blocks in the proposed ADC are designed using only standard digital cells, enabling an auto-generation based on regular digital design tools. Therefore, the proposed ADC provides enhanced portability and reusability which facilitate integration into various functional blocks requiring testing and diagnosis. To implement the SAR ADC, a synthesizable voltage digital-to-analog converter (VDAC) and a rail-to-rail hybrid comparator are proposed in this paper. An inherited nonlinearity of the standard-cell-based VDAC is compensated by a histogram-based soft calibration which can be easily embedded in a waveform reconstruction module. In addition, an oversampling technique with a redundant error correction method is employed to realize the fully synthesizable design without a sample-and-hold (S/H) circuit. The proposed ADC was fabricated in 28-nm CMOS technology, occupying an active area of 0.002 mm<sup>2</sup>. The ADC achieves 5.39-bit effective-number-of-bit (ENOB) at 500-kS/s sampling rate. The power consumption of the ADC is 92.2 &#x03BC;W with a supply voltage of 0.5 V.
topic Analog-to-digital converter
comparator
digital-to-analog converter
on-chip oscilloscope
redundant error correction
standard-cell-based design
url https://ieeexplore.ieee.org/document/8708173/
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