CONTROL OF MICROCONTROLLER UNDER THE INFLUENCE OF ELECTROSTATIC DISCHARGE

Since the built-in flash-memory microcontroller is an installed program code, we performed an analysis of its resistance to ESD. It was found that the code is damage when exposed to ESD voltage of less critical by 3.06%. This can lead to incorrect triggering and implementing programmed functions. It...

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Bibliographic Details
Main Authors: G. A. Piskun, V. F. Alexeev
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
Online Access:https://doklady.bsuir.by/jour/article/view/79